Available Research by CPIQ Experts

Camera motion and mobile imaging
Feng Xiao; John Pincenti; George John; and Kevin Johnson, Motorola, Inc

Image quality quantification in camera phone applications
Elaine W. Jin, Micron Technology, Inc.

Softcopy quality ruler method: Implementation and validation
Elaine W. Jin; Brian W. Keelan; and Junqing Chen, Aptina Imaging, LLC
Jonathan B. Phillips, Eastman Kodak Company
Ying Chen, Vista Point Technology

Correlating objective and subjective evaluation of texture appearance with applications to camera phone imaging
Elaine W. Jin, Aptina Imaging, LLC
Jonathan B. Phillips and Stephen M. Coppola, Eastman Kodak Company
James H. Clark and Timothy A. Mauer, HP
Ying Chen, Vista Point Technology

Interaction of image noise, spatial resolution, and low contrast fine detail preservation in digital image
Uwe Artmann and Dietmar Wüller, Image Engineering

Slider-adjusted softcopy ruler for calibrated image quality assessment
Elaine W. Jin and Brian W. Keelan, Aptina, LLC

Measuring texture sharpness of a digital camera
Frédéric Cao; Frédéric Guichard; and Hervé Hornung, DxO Labs

Applying image quality in cell phone cameras: lens distortion
Donald Baxter, STMicroelectronics
Sergio R. Goma and Milivoje Aleksic, AMD

Validating a texture metric for camera phone images using a texture-based softcopy attribute ruler
Jonathan B. Phillips and Douglas Christoffel, Eastman Kodak Company

Dead leaves model for measuring texture quality on a digital camera
Frédéric Cao; Frédéric Guichard; and Hervé Hornung, DxO Labs

Texture-based measurement of spatial frequency response using the dead leaves target: extensions, and application to real camera systems
Elaine W. Jin, Aptina Imaging Corporation
Jon McElvain; Scott P. Campbell; and Jonathan Miller, Digital Imaging Systems

Toward a quantitative visual noise evaluation of sensors and image processing pipes
Clémence Mornet, STMicroelectronics and Institut de Microélectronique Électromagnétisme et Photonique
Donald Baxter; Isabelle Schanen; Jérôme Vaillant; Thomas Decroux; and Didier Herault, STMicroelectronics

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